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mssa 2015 technical forum program

 

Monday 30 NOVEMBER 2015

 

TECHNICAL FORUM

07.00 - 08.30

REGISTRATION

08.30 - 08.40

WELCOME AND OPENING REMARKS

SESSION 1


TEM TECHNIQUES

Chair: Jaco Olivier

08.40 - 09.00

Dominique Delille

The in-situ challenge of better understanding Structure-Properties relationship in nanomaterials : Possible solutions and illustrations

09.00 - 09.20

Muriel Véron

ASTAR: an efficient tool for TEM characterization

09.20 - 09.40

Andrew Yarwood

An introduction to the latest TEM designs and features from JEOL

09.40 - 10.00

Dominique Delille

Study of Low-Angle boundaries in Graphene-like materials: an example of optimizing imaging conditions in a Cs-corrected S/TEM

10.00 ”“ 10.20

Paul Spellward

One View: TEM Imaging Re-invented

 

10.20 - 10.40

 

TEA

SESSION 2


SEM TECHNIQUES

Chair:  Andy Yarwood

10.40 - 11.00

Andrew Yarwood

An Introduction to the latest developments in JEOL SEM’s

11.00 - 11.20

Paul Spellward

Applications of Cathodoluminescence (what do I see with CL?)

11.20 - 11.40

Max Patzschke

Enhanced information on SEM through combined complimentary methods

11.40 - 12.00

Keith Dicks

New Electron Back Scatter Diffraction (EBSD) developments ”“ advances in detector performance, band detection and indexing algorithms

12.00 - 13.00

 

LUNCH

 

 

Monday  30 NOVEMBER 2015 ”“ AFTERNOON

SESSION 3


SPECTROSCOPY

Chair: Mike Lee

13.00 - 13.20

Cees Heijboer

WDS Spectrometer Technologies - Not all WDS spectrometers are created equally

13.20 - 13.40

John Maddock

New EDS detector design X-Max Extreme for maximising spatial resolution and surface sensitivity of EDS in FEG-SEM

13.40 ”“ 14.00

Rene de Kloe

Data averaging tools for improved mapping results

14.00 ”“ 14.20

Cees Heijboer

Making live-time SEM/EDS phase mapping a reality

SESSION 4


CORRELATIVE MICROSCOPY

Chair:  Grant Martins

14.20 - 14.40

Lize Engelbrecht

Correlative microscopy for Biology: bridging the gap between fluorescence and electron microscopy

14.40 - 15.00

J P Gabriel

Advances in Correlative Super-resolution Light and Electron Microscopy

15.00 - 15.20

Will Harris

High resolution X-ray microscopy as a core facility for correlative imaging

15.20 - 15.40

 

AFTERNOON TEA

 

SESSION 5


SAMPLE PREPARATION

Chair: Alan Hall

15.40 - 16.00

Paul Spellward

Broad Argon beam sample preparation for SEM and TEM

16.00 - 16.20

Andreas Nowak

Latest developments in high pressure freezing

16.20 - 16.40

Gareth Morgan

The ATUMtome for automated serial sectioning and 3-D imaging.

16.40 ”“ 17.00

Soné Hendriks

PALM MicroBeam ”“ What you see is what you get

 

 

CLOSING REMARKS FOR TECHNICAL FORUM

 


MSSA 2015 TECHnical forum abstracts

The in-situ challenge of better understanding Structure-Properties relationship in nanomaterials : Possible solutions and illustrations

Dominique Delille

FEI Company, Achtseweg Noord 5, 5600KA, Eindhoven, The Netherlands

Email: Dominique.Delille@fei.com

BY MSSA TECH FORUM
The electron microscopy of tomorrow appears to be more and more dynamic, with the growing development of many different ways to look at real-time in-situ experiments. Being one of the world’s leading suppliers of scientific instruments in the field of Transmission Electron Microscopy, FEI is f...  read more
 November 06, 2015
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Technical Forum 2015
MSSA TECH FORUM

ASTAR: an efficient tool for TEM characterization

M. Véron1 and E. Rauch1,2

1Univ. Grenoble Alpes, 2CNRS, SIMAP, F-38000 Grenoble, France

Email: Muriel.Veron@grenoble-inp.fr

BY MSSA TECH FORUM
ASTAR is a TEM attachment that couples beam scanning with electron precession in order to provide orientation and phase mapping of TEM specimens. The process consists in (i) acquiring the precessed electron diffraction (PED) patterns at every location of the scanned area and (ii) analysing the patte...  read more
 November 06, 2015
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An introduction to the latest TEM designs and features from JEOL

A. Yarwood

JEOL (UK) Ltd, Silvercourt, Watchmead, Welwyn Garden City, Herts, AL71LT, UK

Email: Andy.Yarwood@jeoluk.com

BY MSSA TECH FORUM
For many years JEOL has a reputation for making reliable state of the art TEM’s which produce the highest possible performance. Advances in modern technology means that it is possible to improve TEM performance even more and at the same time present new and interesting instruments to replace t...  read more
 November 06, 2015
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Study of Low-Angle boundaries in Graphene-like materials: an example of optimizing imaging conditions in a Cs-corrected S/TEM

D. Delille1, S. Lopatin1 and A. Chuvilin2

1FEI Company, Achtseweg Noord 5, 5600KA Eindhoven, The Netherlands, 2 CIC nanoGUNE, Tolosa Hiribidea 76, E-20018, Donostia - San Sebastian, Spain

Email: Dominique.delille@fei.com

BY MSSA TECH FORUM
Recent advances in spherical aberration (Cs) correction for TEM in combination with electron sources of low energy spread enable imaging of graphene with atomic resolution. Newly developed TEM techniques such as single atom or single atomic column spectroscopy and atomic resolution electron tomograp...  read more
 November 06, 2015
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One View: TEM Imaging Re-invented

P.Spellward

Gatan UK, 25 Nuffield Way, Abingdon, Oxfordshire OX141RL, UK

Email: pspellward@gatan.com

BY MSSA TECH FORUM
Digital cameras for TEMs were initially a film substitute, only used for final acquisition, because they were too slow for use whilst searching or focussing. In more recent times, cameras became faster and could be used more routinely in fast readout modes, at reduced resolution or from sub-areas. W...  read more
 November 06, 2015
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An Introduction to the latest developments in JEOL SEM’s

A. Yarwood

JEOL (UK) Ltd, Silvercourt, Watchmead, Welwyn Garden City, Herts, AL71LT, UK
Email: Andy.Yarwood@jeoluk.com

BY MSSA TECH FORUM
JEOL has been manufacturing scanning electron microscopes for many years and has built up a reputation for high performance and high stability. JEOL instruments are also known to maintain their performance over the many years of use in which they are often expected to operate regardless of the envir...  read more
 November 06, 2015
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Applications of Cathodoluminescence (what do I see with CL?)

P.Spellward and D.Stowe

Gatan UK, 25 Nuffield Way, Abingdon, Oxfordshire OX141RL, UK
Email: pspellward@gatan.com

BY MSSA TECH FORUM
Cathodoluminescence (CL) is the light given off by many materials when excited by an electron beam. It can be collected in the SEM and used to provide important and sometimes unique information about the sample, with SEM resolution.  In geological / earth sciences, colours are meaningful and ...  read more
 November 06, 2015
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Enhanced information on SEM through combined complimentary methods

M. Patzschke

Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany

Email: max.patzschke@bruker.com

BY MSSA TECH FORUM
Energy dispersive X-ray spectroscopy (EDS) using silicon drift detectors (SDD) has become an established and effective method for element analysis in electron microscopy. Today’s state of the art SDDs outperform Si(Li) technology in pulse throughput and are approaching the theoretical limit in...  read more
 November 06, 2015
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New Electron Back Scatter Diffraction (EBSD) developments – advances in detector performance, band detection and indexing algorithms

K.Dicks

Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, HP12 3SE, UK.

Email: keith.dicks@oxinst.com

BY MSSA TECH FORUM
EBSD has advanced dramatically in recent years, benefiting from advances in detector performance (both acquisition speed and sensitivity), band detection and indexing algorithms; notably ‘refined accuracy’ and ‘TKD mode’. Refined accuracy as method has been developed t...  read more
 November 06, 2015
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WDS Spectrometer Technologies - Not all WDS spectrometers are created equally

C. Heijboer and S. Sedio

Thermo Fisher Scientific, Takkebijsters 1, 4817 BL Breda, The Netherlands

Email: cees.heijboer@thermofisher.com

BY MSSA TECH FORUM
Electron Microprobes use wavelength-dispersive (WD) spectrometers that rely on curved diffractors and a Rowland circle geometry. With 5 WD spectrometers and a chamber designed around the unique requirements of the Rowland circle spectrometer geometry, a highly effective x-ray analytical system, with...  read more
 November 06, 2015
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New EDS detector design X-Max Extreme for maximising spatial resolution and surface sensitivity of EDS in FEG-SEM

J. Maddock,  K. Dicks  and S. Burgess

Oxford Instruments NanoAnalysis

Email: simon.burgess@oxinst.com

BY MSSA TECH FORUM
Imaging conditions and methods in the latest ultra-high resolution FEG-SEMs for investigating the morphology and structure of the smallest nano-materials and layers utilises very low kV, minimum beam current and short working distance. These conditions are incompatible with current conventional EDS ...  read more
 November 06, 2015
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Data averaging tools for improved mapping results

R. de Kloe1 and S. Wright2

1EDAX, Ringbaan Noord 103, 5046AA Tilburg, The Netherlands, 2EDAX Inc, 392E 12300S, Suite H, Draper, UT, USA

Email: rene.de.kloe@ametek.nl

BY MSSA TECH FORUM
Both EDS and EBSD chemical, orientation, and phase mapping are standard techniques that are routinely applied on many materials. When the sample is capable of producing high EDS count rates or high quality EBSD patterns, this type of analysis is straightforward. But when the input data quality is no...  read more
 November 06, 2015
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Making live-time SEM/EDS phase mapping a reality

C. Heijboer and D. West

Thermo Fisher Scientific, Takkebijsters 1, 4817 BL Breda, The Netherlands

Email: cees.heijboer@thermofisher.com

BY MSSA TECH FORUM
EDS spectral imaging (SI) data sets contain large amounts of complex information. Generating EDS phase maps from this data with traditional techniques is self-limited by the ability of such techniques to simultaneously handle data sets of this magnitude and complexity. The resulting methods are comp...  read more
 November 06, 2015
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Correlative microscopy for Biology: bridging the gap betweem fluorescence and electron microscopy

L. Engelbrecht

Fluorescent Microscopy Unit, Central Analytical Facilities, Stellenbosch University

Email: lizeb@sun.ac.za

BY MSSA TECH FORUM
The quest to resolve cellular detail in the biological field has developed along two different avenues, namely light and electron microscopy. The first allows samples to be imaged with relatively little interference, making live cell imaging possible. The development of fluorescence microscopy has a...  read more
 November 06, 2015
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Advances in Correlative Super-resolution Light and Electron Microscopy

J.P. Gabriel

Leica – Microsysytems, Ernst-Leitz-Str. 17-37, 35578 Wetzlar, Germany

Email: Jens.Gabriel@leica-microsystems.com

BY MSSA TECH FORUM
In the past two decades, super-resolution fluorescence microscopy techniques have emerged that allow researchers to overcome the diffraction limit of light and study subcellular structures on a nanoscale. The importance of these methods have been recognized by the selection as Method of the Year 200...  read more
 November 06, 2015
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High resolution X-ray microscopy as a core facility for correlative imaging

W. Harris, L. Lavery, A. Merckle and P. Lander

ZEISS XRM Group

Email: pete.lander@zeiss.com

BY MSSA TECH FORUM
X-ray microscopy (XRM) provides non-destructive 3D imaging capabilities on specimens across a range of length scales, observing features with sizes spanning from nanometers to millimeters. Recent developments, inspired by results from dedicated synchrotron sources, have incorporated a number of X-ra...  read more
 November 06, 2015
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Broad Argon beam sample preparation for SEM and TEM

P. Spellward and M. Hassel-Shearer

Gatan UK, 25 Nuffield Way, Abingdon, Oxfordshire OX141RL, UK
Email: pspellward@gatan.com

BY MSSA TECH FORUM
Today's SEMs are using lower voltages and becoming much more surface sensitive. Techniques such as EBSD and CL are advancing rapidly and are increasingly intolerant of poor, mechanically polished samples. Gatan offers a choice of sample preparation tools based on low energy Argon ion beams. The Ilio...  read more
 November 06, 2015
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Latest developments in high pressure freezing

Andreas Nowak

Leica – Microsystems, Ernst-Leitz-Str. 17-37, 35578 Wetzlar, Germany
Email: Andreas.Nowak@leica-microsystems.com

BY MSSA TECH FORUM
Leica Microsystems has launched a High-Pressure Freezer with Fully Integrated Light Stimulation system. High pressure freezing is currently the only method for preserving aqueous samples in their native state. The Leica EM ICE enables users to cryo-fixate samples without introducing structural alter...  read more
 November 06, 2015
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The ATUMtome for automated serial sectioning and 3-D imaging.

P. Webster. D. Bentley and J. Kearney

RMC Boeckeler, Boeckeler Instruments Inc. 4650 South Butterfield Drive, Tucson, Arizona 85714, USA.

Email: garethmorgan@brookes.ac.uk

BY MSSA TECH FORUM
The progress in correlative light and electron microscopy (CLEM) has recently taken a great step forward with the introduction of a device that attaches to an ultramicrotome and collects thin sections of resin embedded material in sequential order. The ATUMtome is an extension of the array tomograph...  read more
 November 06, 2015
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PALM MicroBeam – What you see is what you get

S.L. Hendriks

Carl Zeiss (Pty) Ltd, Oak avenue 363, Ferndale, Randburg
Email: sone.hendriks@zeiss.com

BY MSSA TECH FORUM
The main challenges in Biomedical research is to understand the underlying function or dysfunction on molecular, cellular or tissue level. In the microscopy approach, molecules, cells or tissues are labelled with dyes or markers (for brightfield or fluorescence) to examine structures, protein locali...  read more
 November 06, 2015
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