Monday 30 NOVEMBER 2015

TECHNICAL FORUM

07.00 - 08.30

REGISTRATION

08.30 - 08.40

WELCOME AND OPENING REMARKS

SESSION 1

TEM TECHNIQUES

Chair: Jaco Olivier

08.40 - 09.00

Dominique Delille

The in-situ challenge of better understanding Structure-Properties relationship in nanomaterials : Possible solutions and illustrations

09.00 - 09.20

Muriel Véron

ASTAR: an efficient tool for TEM characterization

09.20 - 09.40

Andrew Yarwood

An introduction to the latest TEM designs and features from JEOL

09.40 - 10.00

Dominique Delille

Study of Low-Angle boundaries in Graphene-like materials: an example of optimizing imaging conditions in a Cs-corrected S/TEM

10.00 ”“ 10.20

Paul Spellward

One View: TEM Imaging Re-invented

10.20 - 10.40

TEA

SESSION 2

SEM TECHNIQUES

Chair:  Andy Yarwood

10.40 - 11.00

Andrew Yarwood

An Introduction to the latest developments in JEOL SEM’s

11.00 - 11.20

Paul Spellward

Applications of Cathodoluminescence (what do I see with CL?)

11.20 - 11.40

Max Patzschke

Enhanced information on SEM through combined complimentary methods

11.40 - 12.00

Keith Dicks

New Electron Back Scatter Diffraction (EBSD) developments ”“ advances in detector performance, band detection and indexing algorithms

12.00 - 13.00

LUNCH

Monday  30 NOVEMBER 2015 ”“ AFTERNOON

SESSION 3

SPECTROSCOPY

Chair: Mike Lee

13.00 - 13.20

Cees Heijboer

WDS Spectrometer Technologies - Not all WDS spectrometers are created equally

13.20 - 13.40

John Maddock

New EDS detector design X-Max Extreme for maximising spatial resolution and surface sensitivity of EDS in FEG-SEM

13.40 ”“ 14.00

Rene de Kloe

Data averaging tools for improved mapping results

14.00 ”“ 14.20

Cees Heijboer

Making live-time SEM/EDS phase mapping a reality

SESSION 4

CORRELATIVE MICROSCOPY

Chair:  Grant Martins

14.20 - 14.40

Lize Engelbrecht

Correlative microscopy for Biology: bridging the gap between fluorescence and electron microscopy

14.40 - 15.00

J P Gabriel

Advances in Correlative Super-resolution Light and Electron Microscopy

15.00 - 15.20

Will Harris

High resolution X-ray microscopy as a core facility for correlative imaging

15.20 - 15.40

AFTERNOON TEA

SESSION 5

SAMPLE PREPARATION

Chair: Alan Hall

15.40 - 16.00

Paul Spellward

Broad Argon beam sample preparation for SEM and TEM

16.00 - 16.20

Andreas Nowak

Latest developments in high pressure freezing

16.20 - 16.40

Gareth Morgan

The ATUMtome for automated serial sectioning and 3-D imaging.

16.40 ”“ 17.00

Soné Hendriks

PALM MicroBeam ”“ What you see is what you get

CLOSING REMARKS FOR TECHNICAL FORUM