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The in-situ challenge of better understanding Structure-Properties relationship in nanomaterials : Possible solutions and illustrations

Dominique Delille

FEI Company, Achtseweg Noord 5, 5600KA, Eindhoven, The Netherlands

Email: Dominique.Delille@fei.com


The electron microscopy of tomorrow appears to be more and more dynamic, with the growing development of many different ways to look at real-time in-situ experiments. Being one of the world’s leading suppliers of scientific instruments in the field of Transmission Electron Microscopy, FEI is focused on developing in-situ microscopy at ultra-high resolution. This is done not only through better integration of existing third party portable in-situ solutions and sample holders, but also by maintaining development in the very demanding field of Environmental Transmission Electron Microscopy (ETEM).  The presentation will highlight the latest developments in both directions.


Firstly this will be demonstrated by presenting the progress that has been made in the world of ETEM using the very latest application results. This will be followed by a full review of the enhanced versatility of the most recent TEM’s and their use of various in-situ sample holders, either from FEI or from other suppliers.  Examples will be shown to give insight into how much a ‘standard’ TEM, Cs corrected or not, can associate with the most advanced in-situ solutions and become a surprising laboratory at the sub-nanometer scale.

 November 06, 2015
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