JEOL has been manufacturing scanning electron microscopes for many years and has built up a reputation for high performance and high stability. JEOL instruments are also known to maintain their performance over the many years of use in which they are often expected to operate regardless of the environment. In this presentation the latest developments in both conventional and field emission SEM from JEOL Ltd. will be shown.  JEOL has worked hard to provide innovative SEMs especially with respect to the user interface. Many users are now familiar with smart phone and tablet technology. Our newest tungsten SEMs and their simple graphical user interfaces which resemble the interface seen on many portable devices will be introduced. The fully integrated EDS is one of the main features of the new SEMs as it means that a single standard PC is used to operate the complete system, making it both more compact and simpler to use. With the field emission SEM range JEOL is now introducing a new mid-range FESEM designed to be ready for use with all the latest techniques. This is especially true with options such as Serial Block Face SEM. Features will be discussed and examples presented of how the new JEOL FESEM improves the operation and performance in a modern laboratory environment.