For many years JEOL has a reputation for making reliable state of the art TEM’s which produce the highest possible performance. Advances in modern technology means that it is possible to improve TEM performance even more and at the same time present new and interesting instruments to replace the existing JEOL range of TEMs. This presentation will present an overview of all our current TEM designs and at the same time present our latest 200kV TEM products. The 200kV market is an extremely competitive market, especially in an environment where operators are often asked to use very high performance TEMs to a very high standard even though the operator experience is rather limited. A modern and reliable software interface as well as easy setup for extended TEM techniques such as tomography and high performance EDS will be found in all our latest TEM designs. Details will be included on our latest 200kV field emission TEM as this instrument in particular demonstrates how JEOL is advancing its latest designs to give the best possible TEM experience to the electron microscopy world.